A Study and Characterization of Thin Film Multilayer Structures (MLS) With si/sio2 Composition Si Substrate (Record no. 561119)

000 -LEADER
fixed length control field 00413nam a2200133Ia 4500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20210429153915.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 210429s9999 xx 000 0 und d
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number MTL-MS IQ/MJ
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Khurram Iqbal
9 (RLIN) 54759
245 #2 - TITLE STATEMENT
Title A Study and Characterization of Thin Film Multilayer Structures (MLS) With si/sio2 Composition Si Substrate
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. ISLAMABAD
Name of publisher, distributor, etc. SCME
Date of publication, distribution, etc. 2010
300 ## - PHYSICAL DESCRIPTION
Extent 47P
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme
Koha item type Reference
Holdings
Withdrawn status Lost status Damaged status Not for loan Permanent Location Current Location Date acquired Total Checkouts Full call number Barcode Date last seen Price effective from Koha item type
        School of Chemical & Materials Engineering (SCME) School of Chemical & Materials Engineering (SCME)     MTL-MS IQ/MJ SCME-T0045 04/29/2021 04/29/2021 Reference
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