Next generation wireless LANs : throughput, robustness, and reliability in 802.11n throughput, robustness, and reliability in 802.11n Eldad Perahia and Robert Stacey.
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TextPublisher: Cambridge, UK ; New York : Cambridge University Press, 2008Description: xxx, 385 p. : ill. ; 26 cmISBN: 0521885841 (hbk.); 9780521885843 (hbk.)Subject(s): Wireless LANsDDC classification: 621.398 LOC classification: TK5105.78 | .P47 2008Online resources: Table of contents only
| Item type | Current location | Home library | Collection | Shelving location | Call number | Status | Date due | Barcode | Item holds |
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Central Library (CL) | Central Library (CL) | NFIC | General Stacks | 621.398 PER (Browse shelf) | Available | SEECS012107 |
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| 621.39732 LEE The design of CMOS radio frequency integrated circuits | 621.39732 MUR Digitally assisted pipeline ADCs: theory and implementation | 621.39732 STE Structured analog CMOS design | 621.398 PER Next generation wireless LANs : throughput, robustness, and reliability in 802.11n | 621.3981 ABA WiMax RF systems engineering | 621.3981 CIA Guide to Wireless Communications | 621.3981 HOF GPRS demystified |
Includes bibliographical references and index.
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