Dynamic characterisation of analogue-to-digital converters / by Dominique Dallet and Jos⥠Machado da Silva (eds.).
Series: Kluwer international series in engineering and computer science: ; Kluwer international series in engineering and computer science: Publisher: Dordrecht : Springer, c2005Description: xx, 280 p. : ill. ; 25 cmISBN: 0387259023; 0387259031 (ebook); 9780387259024; 9780387259031Subject(s): Telecommunication EngineeringDDC classification: 621.3815322,DAL Online resources: Contributor biographical information | Publisher description | Table of contents only
Contents:
ADC Characterization Based on Sine wave Analysis (Page-3), Sinewave Test Setup (Page-47), Time Domain Data Analysis (Page-61), Frequency Domain Data Analysis (Page-85), Code Histogram Test (Page-105), Comparative Study of ADC Sine wave Test Methods (Page-157), Jitter Measurement (Page-219), Differential Gain and Phase Testing (Page-235), Step and Transient Response Measurement (Page-243), Hysteresis Measurement (Page-255).
| Item type | Current location | Home library | Shelving location | Call number | URL | Status | Notes | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|---|---|
Reference
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Military College of Signals (MCS) | Military College of Signals (MCS) | Reference | 621.3815322,DAL (Browse shelf) | Link to resource | Not for loan | Almirah No.21, Shelf No.5 | MCS32507 |
Total holds: 0
ADC Characterization Based on Sine wave Analysis (Page-3), Sinewave Test Setup (Page-47), Time Domain Data Analysis (Page-61), Frequency Domain Data Analysis (Page-85), Code Histogram Test (Page-105), Comparative Study of ADC Sine wave Test Methods (Page-157), Jitter Measurement (Page-219), Differential Gain and Phase Testing (Page-235), Step and Transient Response Measurement (Page-243), Hysteresis Measurement (Page-255).
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