NUST Institutions Library Catalogue catalog › Details for: CMOS circuit design, layout, and simulation /

Normal view MARC view ISBD view

CMOS circuit design, layout, and simulation / R. Jacob Baker, Harry W. Li, and David E. Boyce.

By: Baker, R. Jacob Contributor(s): Boyce, David E, 1940- | Li, Harry W, 1960- | Institute of Electrical and Electronics Engineers Series: IEEE Press series on microelectronic systemsPublisher: New York : IEEE Press, c1998Description: xxiv, 902 p. : ill. ; 24 cmISBN: 81-203-1682-7Subject(s): Integrated circuit layout | Metal oxide semiconductor field-effect transistors | Metal oxide semiconductors, Complementary -- Design and construction | Telecommunication engineeringDDC classification: 621.3815,BAK Online resources: Contributor biographical information | Publisher description | Table of Contents

Contents:

Part-1: CMOS Fundamentals (Page-1), Part-2: CMOS Digital Circuits (Page-199), Part-3: CMOS Analog Circuits (Page-425), Part-4: Mixed-Signal Circuits (Page-683).

Tags from this library: No tags from this library for this title. Log in to add tags.

Holdings ( 2 )
Title notes ( 1 )
Comments ( 0 )
Images

Item type	Current location	Home library	Shelving location	Call number	URL	Status	Notes	Date due	Barcode	Item holds
Book	Military College of Signals (MCS)	Military College of Signals (MCS)	General Stacks	621.3815,BAK (Browse shelf)	Link to resource	Available	Almirah No.32, Shelf No.5		MCS31952
Book	Military College of Signals (MCS)	Military College of Signals (MCS)	General Stacks	621.3815,BAK (Browse shelf)	Link to resource	Available	Almirah No.32, Shelf No.5		MCS31953

Total holds: 0

Browsing Military College of Signals (MCS) shelves, Shelving location: General Stacks Close shelf browser

Previous	No cover image available	No cover image available					No cover image available	Next
Previous	621.3815,ALE Fundamental of Electric Circuits /	621.3815,ANA Analysis and design of integrated circuits /	621.3815,BAK CMOS circuit design, layout, and simulation /	621.3815,BAK CMOS circuit design, layout, and simulation /	621.3815,BAR Built-in test for VLSI : pseudorandom techniques /	621.3815,BEC Design of systems and circuits for maximum reliability or maximum production yield /	621.3815,BEL Electronic devices and circuits /	Next

Part-1: CMOS Fundamentals (Page-1), Part-2: CMOS Digital Circuits (Page-199), Part-3: CMOS Analog Circuits (Page-425), Part-4: Mixed-Signal Circuits (Page-683).

There are no comments on this title.

to post a comment.

Click on an image to view it in the image viewer