NUST Institutions Library Catalogue catalog › Details for: Principles of measurement systems /

Normal view MARC view ISBD view

Principles of measurement systems / John P. Bentley.

By: Bentley, John P Publisher: New York : Pearson Prentice Hall, 2000Edition: 3rd edDescription: 468pISBN: 9814053848Subject(s): Automatic control | Engineering instruments | Physical instruments | Physical measurementsDDC classification: 530.8,BEN

Contents:

The General Measurement Systems (Page-3), Typical Measurement Sys Elements (Page-135), Specialized Measurement Systems (Page-275), Optical Measurement Sys (Page-343), Ultrasonic Measurement Systems (Page-384), Gas Chromatography (Page-417), Data Acquisition And Comm. Systems (Page-431).

Tags from this library: No tags from this library for this title. Log in to add tags.

Holdings ( 1 )
Title notes ( 1 )
Comments ( 0 )
Images

Item type	Current location	Home library	Shelving location	Call number	URL	Status	Notes	Date due	Barcode	Item holds
Book	Military College of Signals (MCS)	Military College of Signals (MCS)	General Stacks	530.8,BEN (Browse shelf)	Link to resource	Available	Almirah No.16, Shelf No.2		MCS28585

Total holds: 0

Browsing Military College of Signals (MCS) shelves, Shelving location: General Stacks Close shelf browser

Previous	No cover image available	No cover image available	No cover image available			No cover image available		Next
Previous	530.78,MEL Experiments in modern physics /	530.78,MEL Experiments in modern physics /	530.78,MEL Experiments in modern physics /	530.8,BEN Principles of measurement systems /	530.8,PRO Proceedings of first national conference on condition monitoring and diagnostics : 21-23 April, 2001, Pakistan Academy of Sciences, Islamabad /	530, GOT Fundamentals of transistor Physics	530, HAL Student solutios manual physics /	Next

There are no comments on this title.

to post a comment.

Click on an image to view it in the image viewer