Electronic materials science : for integrated circuits in Si and GaAs / James W. Mayer, S.S. Lau.
Publisher: New York : London : Macmillan ; Collier Macmillan, c1990Description: xx, 476 p. : ill. ; 25 cmISBN: 0023781408Subject(s): Integrated circuits -- Design and construction | Integrated circuits -- Materials | Transistor circuits -- Design and construction | Transistor circuits -- MaterialsDDC classification: 621.38131,MAY| Item type | Current location | Home library | Shelving location | Call number | URL | Status | Notes | Date due | Barcode | Item holds |
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Military College of Signals (MCS) | Military College of Signals (MCS) | General Stacks | 621.38131,MAY (Browse shelf) | Available | Almirah No.32, Shelf No.3 | MCS20746 | |||
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Military College of Signals (MCS) | Military College of Signals (MCS) | General Stacks | 621.38131,MAY (Browse shelf) | Link to resource | Available | Almirah No.32, Shelf No.3 | MCS22643 |
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| 621.381076,ZBA Industrial electronics : a text-lab manual / | 621.38121,ZWO Digital system design with VHDL / | 621.38131,MAY Electronic materials science : for integrated circuits in Si and GaAs / | 621.38131,MAY Electronic materials science : for integrated circuits in Si and GaAs / | 621.38131,WAV Wave Propagation / | 621.38132,ADV Advances in electronic circuit packaging Vol-2 / | 621.38132,ADV Advances in electronic circuit packaging Vol-2 / |
Integrated Circuits (Page-1), Current Flow and Capacitance (Page-27), Band, Bonds and Semiconductor (Page-51), Barriers and Junctions (Page-82), Transistor Bipolar and Field Effect (Page-111), Crystallography and Crystalline Defects (Page-142), Diffusion in Solids (Page-183), Ion Implantation (Page-222), Thermal Oxidation of Silicon and Chemical Vapor Deposition (Page-251), Metallization and Phase Diagrams (Page-276), Reaction Kinetics Sillicides, Aluminides ad Diffusion Barriers (Page-306), Energy Bands and Wave Behavior (Page-340), Transistor and Laser (Page-375), Assembly and Packing (Page-440),
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