Integrated circuit design, fabrication, and test / Peter Shepherd.
Publisher: New York : McGraw-Hill, c1996Description: xv, 223 p. : ill. ; 24 cmISBN: 0333630394Subject(s): Integrated circuits -- Testing | Telecommunication engineeringDDC classification: 621.3815,SHE Online resources: Table of contents
Contents:
The IC Design Process Where do we Start (Page-1), IC Families What technologies can we use (Page-21),Transistor Level Design (Page-42), IC Realization (Page-97), CAD how can we make the tasks Possible (Page-117), Testing how can we check it works (Page-146), Afterword the Future (Page-176).
| Item type | Current location | Home library | Shelving location | Call number | URL | Status | Notes | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|---|---|
Book
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Military College of Signals (MCS) | Military College of Signals (MCS) | General Stacks | 621.3815,SHE (Browse shelf) | Link to resource | Available | Almirah No.33, Shelf No.2 | MCS28516 |
Total holds: 0
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| 621.3815,RAS Introduction to PSpice using OrCAD for circuits and electronics / (Include CD) | 621.3815,ROB Spice for Microelectronic Circuits / | 621.3815,SAL Digital circuits and design / | 621.3815,SHE Integrated circuit design, fabrication, and test / | 621.3815,SHI Electronic circuits / | 621.3815,SIG Analog Data Manual 1983 / | 621.3815,SIG Integrated Circuits Signetics Linear LSI Marketing / |
The IC Design Process Where do we Start (Page-1), IC Families What technologies can we use (Page-21),Transistor Level Design (Page-42), IC Realization (Page-97), CAD how can we make the tasks Possible (Page-117), Testing how can we check it works (Page-146), Afterword the Future (Page-176).
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