Digital test engineering / J. Max Cortner.
Publisher: New York : Wiley, 1987Description: xiv, 337 p. ; 25 cmISBN: 0471851353Subject(s): Telecommunication EngineeringDDC classification: 621.381548,COR Online resources: Publisher description | Table of Contents
Contents:
Faults and Failure Mechanisms (Page-1), Digital Testing Overview (Page-28), Stimulus Generation (Page-53), Expected Response Determination (Page-84), Circuit and Fault Modeling (Page-100), Automatic Test Equipment (Page-135), Device-Under Test Interface (Page-162), ATE Languages (Page-184), Diagnostics and Troubleshooting Aids (Page-206), Memory Testing (Page-233), Design for Testability (Page-265), Test Planning (Page-293).
| Item type | Current location | Home library | Shelving location | Call number | URL | Status | Notes | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|---|---|
Book
|
Military College of Signals (MCS) | Military College of Signals (MCS) | General Stacks | 621.381548,COR (Browse shelf) | Link to resource | Available | Almirah No.34, Shelf No.6 | MCS7392 |
Total holds: 0
Faults and Failure Mechanisms (Page-1), Digital Testing Overview (Page-28), Stimulus Generation (Page-53), Expected Response Determination (Page-84), Circuit and Fault Modeling (Page-100), Automatic Test Equipment (Page-135), Device-Under Test Interface (Page-162), ATE Languages (Page-184), Diagnostics and Troubleshooting Aids (Page-206), Memory Testing (Page-233), Design for Testability (Page-265), Test Planning (Page-293).
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