Design of systems and circuits for maximum reliability or maximum production yield / Peter W. Becker, Finn Jensen.
Publisher: New York : McGraw-Hill, c1977Description: xiv, 293 p. : ill. ; 24 cmISBN: 0070042306 :Subject(s): Telecommunication EngineeringDDC classification: 621.3818,BEC
Contents:
Introduction (Page-1), Some Basic Reliability Concepts (Page-5), Mathematical Design (Page-69), A Mathematical Model of Yield or of Drift Reliability (Page-83), Methods for Computing the Probability of System or Circuit Success (Page-103), Basis for the Prediction of Yield and Drift Reliability (Page-152), Optimization Techniques (Page-176), Circuit Examples Illustrating the use of the Proposed Design Strategies (Page-193).
| Item type | Current location | Home library | Shelving location | Call number | URL | Status | Notes | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|---|---|
Book
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Military College of Signals (MCS) | Military College of Signals (MCS) | General Stacks | 621.3818,BEC (Browse shelf) | Link to resource | Available | Almirah No.34, Shelf No.6 | MCS5442 | ||
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Book
|
Military College of Signals (MCS) | Military College of Signals (MCS) | General Stacks | 621.3818,BEC (Browse shelf) | Link to resource | Available | Almirah No.34, Shelf No.6 | MCS5443 | ||
|
Book
|
Military College of Signals (MCS) | Military College of Signals (MCS) | General Stacks | 621.3818,BEC (Browse shelf) | Link to resource | Available | Almirah No.34, Shelf No.6 | MCS5444 |
Total holds: 0
Introduction (Page-1), Some Basic Reliability Concepts (Page-5), Mathematical Design (Page-69), A Mathematical Model of Yield or of Drift Reliability (Page-83), Methods for Computing the Probability of System or Circuit Success (Page-103), Basis for the Prediction of Yield and Drift Reliability (Page-152), Optimization Techniques (Page-176), Circuit Examples Illustrating the use of the Proposed Design Strategies (Page-193).
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