LSI/VLSI testability design / Frank F. Tsui.
Publisher: New York : McGraw-Hill, c1987Description: xv, 702 p. : ill. ; 24 cmISBN: 0070653410 :Subject(s): Integrated circuits -- Large scale integration -- Testing | Integrated circuits -- Very large scale integration -- TestingDDC classification: 621.395,TSU
Contents:
Introduction (Page-1), Conventional Test Methods (Page-31), Problems In Testing (Page-52), Design For Testability (Page-75), Latch Scanning Arrangements (Page-102), Switching Of Input/ Output Ports (Page-136), Internal Pattern Generation And Response Compaction (Page-169), Isolation And Self Sufficiency (Page-213), Software And Equipment Supports (Page-260), Taking Stock And Looking Ahead (Page-313), A Penny For My Thoughts (Page-394), Future Of Test Engineering (Page-447).
| Item type | Current location | Home library | Shelving location | Call number | URL | Status | Notes | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|---|---|
Book
|
Military College of Signals (MCS) | Military College of Signals (MCS) | General Stacks | 621.395,TSU (Browse shelf) | Link to resource | Available | Almirha No 124, Shelf No 5 | MCS810 |
Total holds: 0
Introduction (Page-1), Conventional Test Methods (Page-31), Problems In Testing (Page-52), Design For Testability (Page-75), Latch Scanning Arrangements (Page-102), Switching Of Input/ Output Ports (Page-136), Internal Pattern Generation And Response Compaction (Page-169), Isolation And Self Sufficiency (Page-213), Software And Equipment Supports (Page-260), Taking Stock And Looking Ahead (Page-313), A Penny For My Thoughts (Page-394), Future Of Test Engineering (Page-447).
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