Atomic and nuclear analytical methods : XRF, Mössbauer, XPS, NAA and ion-beam spectroscopic techniques / H.R. Verma.
Material type:
TextPublisher: Berlin ; New York : Springer, c2007Description: xiv, 375 p. : ill. ; 24 cmISBN: 9783540302773 (acidfree paper)Other title: XRF, Mössbauer, XPS, NAA and ion-beam spectroscopic techniquesSubject(s): Atomic spectroscopy | Nuclear spectroscopy | Spectrum analysis | Particles (Nuclear physics) | Spectroscopie | Particules (Physique nucléaire) | Beschleuniger-Massenspektrometrie | Ionenstrahlanalyse | Mössbauer-Spektroskopie | Neutronenaktivierungsanalyse | Röntgen-Photoelektronenspektroskopie | RöntgenspektroskopieDDC classification: 540.5540 LOC classification: QC454.A8 | V47 2007Other classification: 530 | UM 2200 Online resources: Table of contents | Item type | Current location | Home library | Shelving location | Call number | Status | Date due | Barcode | Item holds |
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Book
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School of Mechanical & Manufacturing Engineering (SMME) | School of Mechanical & Manufacturing Engineering (SMME) | General Stacks | 540.5540 VER (Browse shelf) | Available | SMME-1792 |
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Includes bibliographical references (p. [341]-364) and index.
X-ray fluorescence (XRF) and particle-induced X-ray emission (PIXE) -- Rutherford backscattering spectroscopy -- Elastic recoil detection -- Mössbauer spectroscopy (MS) -- X-ray photoelectron spectroscopy -- Neutron activation analysis -- Nuclear reaction analysis and particle-induced gamma-ray emission -- Accelerator mass spectroscopy (AMS) -- Appendixes.
hardcover
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