Dimensional Inspection System for Meso-Scale Artefacts Using Sub Pixel Edge Detection Technique / Adeel Wahab.

By: Wahab, AdeelContributor(s): Dr. Umar Shahbaz KhanMaterial type: TextTextPublisher: Islamabad: CEME - NUST, 2013Description: 72 p. : ill. ; 30cmSubject(s): Mechatronics Engineering MS-ThesisDDC classification: 621
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