Principles of semiconductor network testing
Material type:
TextPublisher: USA BUTTERWORTH 1995Description: XIV, 213PISBN: 0-7506-9472-6Subject(s): INTEGRATING CIRCUIT TESTING SEMICONDUCTORS TESTINGDDC classification: 621.381548 AFS'P
| Item type | Current location | Home library | Shelving location | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Book
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College of Electrical & Mechanical Engineering (CEME) | College of Electrical & Mechanical Engineering (CEME) | General Stacks | 621.381548 AFS'P (Browse shelf) | Available | CEME-31918 | ||
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Book
|
College of Electrical & Mechanical Engineering (CEME) | College of Electrical & Mechanical Engineering (CEME) | General Stacks | 621.381548 AFS'P (Browse shelf) | Available | CEME-31819 | ||
|
Book
|
College of Electrical & Mechanical Engineering (CEME) | College of Electrical & Mechanical Engineering (CEME) | General Stacks | 621.381548 AFS'P (Browse shelf) | Available | CEME-31820 |
Total holds: 0
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| 621.381542 REY'C CATHODE RAYS OSCILLOGRAPHS | 621.381548 AFS'P Principles of semiconductor network testing | 621.381548 AFS'P Principles of semiconductor network testing | 621.381548 AFS'P Principles of semiconductor network testing | 621.381548 ANA Electronic instruments and instrumentation technology | 621.381548 ANA Electronic instruments and instrumentation technology | 621.381548 BEL'E Electronic instrumentation and measurements |
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