Testing and diagnosis of analog circuits and systems

By: Liu, Ruey-WenMaterial type: TextTextPublisher: NEWYORK VAN NOSTRAND 1991Description: 284PISBN: 0-442-25932-8Subject(s): ANALOG ELECTRONIC SYSTEMS-TESTING ANALOG CIRCUITS AND SYSTEMSDDC classification: 621.381 TES
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Item type Current location Home library Shelving location Call number Status Date due Barcode Item holds
Book Book College of Electrical & Mechanical Engineering (CEME)
College of Electrical & Mechanical Engineering (CEME)
General Stacks 621.381 TES (Browse shelf) Available CEME-32456
Total holds: 0

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