NUST Institutions Library Catalogue catalog › Details for: Gate dielectric integrity :

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Gate dielectric integrity :

Material type: Text

TextPublisher: ASTM, West Conshocken, Pa. : 2000Description: xi, 169 pDDC classification: 621.38152

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Item type	Current location	Home library	Call number	Status	Date due	Barcode	Item holds
Book	US-Pakistan Center for Advanced Studies in Energy (USPCAS-E)	US-Pakistan Center for Advanced Studies in Energy (USPCAS-E)	621.38152 GAT (Browse shelf)	Available		CAS-E0003999

Total holds: 0

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Previous	621.38152 Handbook of thin film materials /	621.38152 ALF Fundamentals of nanoscale film analysis /	621.38152 CHE Chemical solution deposition of functional oxide thin films /	621.38152 GAT Gate dielectric integrity :	621.38152 KIT Principles of solar cells, LEDs and related devices :	621.38152 MIL Millman's electronic devices and circuits /	621.38152 MIL Millman's electronic devices and circuits /	Next

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