NUST Institutions Library Catalogue

VLSI test principles and architectures: design for testability design for testability edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen

Contributor(s): Wang, Laung-Terng | Wu, Cheng-Wen | Wen, XiaoqingSeries: The Morgan Kaufmann series in systems on siliconPublisher: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006Description: xxx, 777 p. : ill. ; 25 cmISBN: 0123705975; 0123705975Other title: VLSI test principles and architectures [electronic resource]Subject(s): Integrated circuits -- Very large scale integration -- Testing | Integrated circuits -- Very large scale integration -- Design
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Item type Current location Home library Collection Shelving location Call number Status Date due Barcode Item holds
Book Book Central Library (CL)
Central Library (CL)
NFIC General Stacks 621.395 WAN (Browse shelf) Available SEECS008518
Total holds: 0

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