Montrose, Mark I. <br/><br/>
Testing for EMC compliance: approaches and techniques   approaches and techniques / 
Mark I. Montrose, Edward M. Nakauchi. 
 - Hoboken, NJ :  John Wiley,  2004. 
 - xviii, 460 p. :  ill. ;  24 cm. 
<br/><br/>Includes bibliographical references (p. 447-451) and index. 
<br/><br/><label>ISBN: </label>047143308X  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electromagnetic compatibility.<br/>Electromagnetic interference.
<br/><br/><label>Dewey Class. No.: </label>621.38224