TY  - BOOK
AU  - Montrose,Mark I.
AU  - Nakauchi,Edward M.
TI  - Testing for EMC compliance: approaches and techniques : approaches and techniques 
SN  - 047143308X 
U1  - 621.38224 22
PY  - 2004///
CY  - Hoboken, NJ
PB  - John Wiley
KW  - Electromagnetic compatibility
KW  - Electromagnetic interference
N1  - Includes bibliographical references (p. 447-451) and index
UR  - http://www.loc.gov/catdir/bios/wiley046/2003063488.html
UR  - http://www.loc.gov/catdir/description/wiley041/2003063488.html
UR  - http://www.loc.gov/catdir/toc/wiley041/2003063488.html
ER  -