TY  - GEN
AU  - Hartnagel,Hans
AU  - Katilius,Ramunas
AU  - Matulionis,A.
TI  - Microwave noise in semiconductor devices
SN  - 0471384321 (cloth : alk. paper)
U1  - 621.38133,HAR 
PY  - 2001///
CY  - New York
PB  - Wiley
KW  - Semiconductors
KW  - Telecommunication Engineering
N1  - Introduction (Page-1), Kinetic Theory of Nonequilibrium Processes (Page-16), Fluctuations: Kinetic Theory (Page-25), Effect of Interelectron Collisions on Fluctuation Phenomena (Page-37), Boltzmann-Langevin Equation (Page-44), Fluctuations and Diffusion (Page-50), Features of Hot-Electron Fluctuation Spectra (Page-62), Experimental Techniques (Page-81), Hot-Electron Microwave Noise in Elementary Semiconductors (Page-96), Hot-Electron Microwave Noise in GaAs and InP (Page-116), Length-Dependent Hot-Electron Noise (Page-128), Hot-Electron Noise in Doped Semiconductors: Theory (Page-147), Electronic Noise in Standard-Doped n-Type GaAs (Page-161), Electron Diffusion in Standard-Doped n-Type GaAs (Page-175), Electronic Subbands in Quantum Wells (Page-181Hot-Electron Noise in ALGaAs/GaAs 2DEG Channels (Page-197), Hot-Electron Noise in InP-Based 2DEG Channels (Page-209),  Cutoff Frequencies of Fast and Ultrafast Processes (Page-220), Spatially Inhomogeneous Fluctuations (Page-230), Monte Carlo Approach to Microwave Noise in Devices (Page-245),
UR  - http://www.loc.gov/catdir/bios/wiley042/00043688.html
UR  - http://www.loc.gov/catdir/description/wiley034/00043688.html
UR  - http://www.loc.gov/catdir/toc/onix06/00043688.html
ER  -