Dynamic characterisation of analogue-to-digital converters / 
by Dominique Dallet and Jos⥠Machado da Silva (eds.). 
 - Dordrecht :  Springer,  c2005. 
 - xx, 280 p. :  ill. ;  25 cm. 
 - The Kluwer international series in engineering and computer science ;  Analog circuits and signal processing  SECS 860. .
 - Kluwer international series in engineering and computer science ; Kluwer international series in engineering and computer science. .
<br/><br/>ADC Characterization Based on Sine wave Analysis (Page-3), Sinewave Test Setup (Page-47), Time Domain Data Analysis (Page-61), Frequency Domain Data Analysis  (Page-85), Code Histogram Test (Page-105), Comparative Study of ADC Sine wave Test Methods (Page-157), Jitter Measurement (Page-219), Differential Gain and Phase Testing (Page-235), Step and Transient Response Measurement (Page-243), Hysteresis Measurement (Page-255). 
<br/><br/><label>ISBN: </label>0387259023 0387259031 (ebook) 9780387259024 9780387259031 
<br/><br/><label>LCCN: </label>2006401454 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Telecommunication Engineering.
<br/><br/><label>Dewey Class. No.: </label>621.3815322,DAL