Sirohi, R. S. <br/><br/>
Optical methods of measurement :  wholefield techniques / 
Rajpal S. Sirohi, Fook Siong Chau. 
 - New York :  Marcel Dekker,  1999. 
 - xiv, 323 p. :  ill. ;  25 cm. 
 - Optical engineering ;  v. 65 .
 - Optical engineering (Marcel Dekker, Inc.) ; .
<br/><br/>Waves (Page-1), Diffraction (Page-17), Phase Evaluation Methods (Page-33), Detectors and Recording Materials (Page-50) ,Holographic Interferon (Page-77), Speckle Metro logy (Page-127), Photoelectric (Page-183), The Moire  Phenomenon (Page-227). 
<br/><br/><label>ISBN: </label>0824760034 (alk. paper) 
<br/><br/><label>LCCN: </label>99015000 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Telecommunication engineering
<br/><br/><label>Dewey Class. No.: </label>621.3827,SIR