Unified optical scanning technology /
Leo Beiser.
- New York : Wiley-Interscience, c2003.
- xiii, 185 p. : ill. ; 25 cm.
Introduction (Page-1), Scanning Theory And Processes (Page-19), Scanned Resolution (Page-45), Scanner Devices And Techniques (Page-63), Control Of Scanner Beam Misplacement (Page-147), Summary (Page-161).