TY  - GEN
AU  - Becker,Peter W.
AU  - Jensen,Finn
TI  - Design of systems and circuits for maximum reliability or maximum production yield
SN  - 0070042306 :
U1  - 621.3815,BEC 
PY  - 1977///
CY  - New York
PB  - McGraw-Hill
KW  - Electronic circuit design
KW  - Data processing
KW  - Electronic systems
KW  - Design and construction
KW  - Telecommunication engineering
N1  - Introduction (Page-1), Some Basic Reliability Concepts (Page-5), Mathematical Design (Page-69), A Mathematical Model of Yield of Drift Reliability (Page-83), Methods for Computing the Probability of System or Circuit Success (Page-103), Basic for the Prediction of Yield and Drift Reliability (Page-152), Examples of Output-Variable Probability Densities Obtained by Convolution and Monte Carlo Techniques (Page-163), Optimization Techniques (Page-176), Circuit Examples Illustrating the use of the Proposed Design Strategies (Page-193)
ER  -