Amerasekera, E. A. <br/><br/>
Failure mechanisms in semiconductor devices / 
E.A. Amerasekera and D.S. Campbell. 
 - Chichester [West Sussex] ;  New York :  Wiley,  c1987. 
 - xiii, 205 p. :  ill. ;  24 cm. 
<br/><br/>Introduction (Page-1), Reliability Theory (Page-5), Failure Mechanisms (Page-12), Failure Mechanisms and Device Technologies (Page-66), Packing (Page-93), Screening (Page-105), Accelerated Testing (Page-116), Physical Failure Analysis Technology (Page-121), Reliability Prediction and Failure Modeling (Page-129), Quality Assurance (Page-135), Conclusions (Page-143).  
<br/><br/><label>ISBN: </label>0471914347 : 
<br/><br/><label>LCCN: </label>86028174 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Telecommunication Engineering
<br/><br/><label>Dewey Class. No.: </label>621.38152,AME