TY  - GEN
AU  - Amerasekera,E.A.
AU  - Campbell,D.S.
TI  - Failure mechanisms in semiconductor devices
SN  - 0471914347 :
U1  - 621.38152,AME 
PY  - 1987///
CY  - Chichester [West Sussex], New York
PB  - Wiley
KW  - Telecommunication Engineering
N1  - Introduction (Page-1), Reliability Theory (Page-5), Failure Mechanisms (Page-12), Failure Mechanisms and Device Technologies (Page-66), Packing (Page-93), Screening (Page-105), Accelerated Testing (Page-116), Physical Failure Analysis Technology (Page-121), Reliability Prediction and Failure Modeling (Page-129), Quality Assurance (Page-135), Conclusions (Page-143).
UR  - http://www.loc.gov/catdir/enhancements/fy0607/86028174-d.html
UR  - http://www.loc.gov/catdir/enhancements/fy0607/86028174-t.html
ER  -