TY  - GEN
AU  - Van der Ziel,Aldert
TI  - Noise in solid state devices and circuits
SN  - 0471832340 :
U1  - 621.38152,ZIE 
PY  - 1986///
CY  - New York
PB  - Wiley
KW  - Telecommunication Engineering
N1  - Introduction (Page-1), Mathematical Methods (Page-4), Noise Characterization (Page-25), Noise Measurements (Page-43), Thermal Noise (Page-63), Shot Noise (Page-93), Generation- Recombination Noise (Page-120), Flicker Noise or 1/F Noise (Page-145), Noise in Particular Amplifier Circuits (Page-176), Mixers (Page-218), Miscellaneous Problems (Page-249), State of the Art in Low Noise Microwave Design (Page-280)
ER  -