TY  - GEN
AU  - Cortner,J.Max
TI  - Digital test engineering
SN  - 0471851353
U1  - 621.381548,COR 
PY  - 1987///
CY  - New York
PB  - Wiley
KW  - Telecommunication Engineering
N1  - Faults and Failure Mechanisms (Page-1), Digital Testing Overview (Page-28), Stimulus Generation (Page-53), Expected Response Determination (Page-84), Circuit and Fault Modeling (Page-100), Automatic Test Equipment (Page-135), Device-Under Test Interface (Page-162), ATE Languages (Page-184), Diagnostics and Troubleshooting Aids (Page-206), Memory Testing (Page-233), Design for Testability (Page-265), Test Planning (Page-293)
UR  - http://www.loc.gov/catdir/description/wiley032/87008319.html
UR  - http://www.loc.gov/catdir/toc/onix03/87008319.html
ER  -