Tsui, Frank F. <br/><br/>
LSI/VLSI testability design /  
Frank F. Tsui. 
 - New York :  McGraw-Hill,  c1987. 
 - xv, 702 p. :  ill. ;  24 cm. 
<br/><br/>Introduction (Page-1), Conventional Test Methods (Page-31), Problems In Testing (Page-52), Design For Testability (Page-75), Latch Scanning Arrangements (Page-102), Switching Of Input/ Output Ports (Page-136), Internal Pattern Generation And Response Compaction (Page-169), Isolation And Self Sufficiency (Page-213), Software And Equipment Supports (Page-260), Taking Stock And Looking Ahead (Page-313), A Penny For My Thoughts (Page-394), Future Of Test Engineering (Page-447). 
<br/><br/><label>ISBN: </label>0070653410 : 
<br/><br/><label>LCCN: </label>86003005 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Large scale integration--Testing.<br/>Integrated circuits--Very large scale integration--Testing.
<br/><br/><label>Dewey Class. No.: </label>621.395,TSU