TY  - GEN
AU  - Tsui,Frank F.
TI  - LSI/VLSI testability design / 
SN  - 0070653410 :
U1  - 621.395,TSU 
PY  - 1987///
CY  - New York
PB  - McGraw-Hill
KW  - Integrated circuits
KW  - Large scale integration
KW  - Testing
KW  - Very large scale integration
N1  - Introduction (Page-1), Conventional Test Methods (Page-31), Problems In Testing (Page-52), Design For Testability (Page-75), Latch Scanning Arrangements (Page-102), Switching Of Input/ Output Ports (Page-136), Internal Pattern Generation And Response Compaction (Page-169), Isolation And Self Sufficiency (Page-213), Software And Equipment Supports (Page-260), Taking Stock And Looking Ahead (Page-313), A Penny For My Thoughts (Page-394), Future Of Test Engineering (Page-447)
ER  -