Verma, H. R. <br/><br/>
Atomic and nuclear analytical methods :  XRF, Mössbauer, XPS, NAA and ion-beam spectroscopic techniques / 
 XRF, Mössbauer, XPS, NAA and ion-beam spectroscopic techniques 
H.R. Verma. 
 - Berlin ;  New York :  Springer,  c2007. 
 - xiv, 375 p. :  ill. ;  24 cm. 
<br/><br/>Includes bibliographical references (p. [341]-364) and index. 
<br/><br/>X-ray fluorescence (XRF) and particle-induced X-ray emission (PIXE) -- Rutherford backscattering spectroscopy -- Elastic recoil detection -- Mössbauer spectroscopy (MS) -- X-ray photoelectron spectroscopy -- Neutron activation analysis -- Nuclear reaction analysis and particle-induced gamma-ray emission -- Accelerator mass spectroscopy (AMS) -- Appendixes. 
<br/><br/> hardcover 
<br/><br/><label>ISBN: </label>9783540302773 (acidfree paper) 
<br/><br/><label>Publisher. No.: </label>10908259 
<br/><br/><label>LCCN: </label>2006940685 
<br/><br/><label>Nat. Bib. No.: </label>05,N47,0602  dnb 
<br/><br/><label>Nat. Bib. Agency Control No.: </label>97689291X  DE-101 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Atomic spectroscopy.<br/>Nuclear spectroscopy.<br/>Spectrum analysis.<br/>Particles (Nuclear physics)<br/>Spectroscopie.<br/>Particules (Physique nucléaire)<br/>Beschleuniger-Massenspektrometrie.<br/>Ionenstrahlanalyse.<br/>Mössbauer-Spektroskopie.<br/>Neutronenaktivierungsanalyse.<br/>Röntgen-Photoelektronenspektroskopie.<br/>Röntgenspektroskopie.
<br/><br/><label>LC Class. No.: </label>QC454.A8  / V47 2007 
<br/><br/><label>Dewey Class. No.: </label>540.5540  / VER