Chung, Frank H. <br/><br/>
Industrial applications of X-ray diffraction / 
Deane K. Smith. 
 - New York :  Marcel Dekker,  c2000. 
 - xiv, 1006 p. :  ill. ;  26 cm. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><br/>Electronic reproduction. <br/>Boulder, Colo. : <br/>NetLibrary, <br/>2000. <br/>Available via World Wide Web. <br/>Access may be limited to NetLibrary affiliated libraries. 
<br/><br/> HB 
<br/><br/><label>ISBN: </label>0824719921 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Radiography, Industrial.<br/>X-rays--Diffraction.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>TA417.25  / I52 2000eb 
<br/><br/><label>Dewey Class. No.: </label>658.5  / GAI