TY  - GEN
AU  - Taur,Yuan
AU  - Ning,Tak H.
TI  - Fundamentals of modern VLSI devices 
SN  - 0521550564
PY  - 1998///
CY  - Cambrige, UK, New York
PB  - Cambridge University Press
KW  - Metal oxide semiconductors, Complementary
KW  - Bipolar transistors
KW  - Integrated circuits
KW  - Very large scale integration
N2  - "The great advances made in VLSI technology in recent years have been underpinned by rapid developments in the design and fabrication of CMOS and bipolar devices, particularly at the deep submicron level. This book examines in detail the basic properties and design of these devices, including chip integration, and discusses the various factors that affect their performance."--BK JACKET. "The book contains many exercises, and can be used as a textbook for senior undergraduate or first-year graduate courses on microelectronics or VLSI devices. It will also be a valuable reference volume for practicing engineers involved in research and development in the electronics industry."--BK JACKET
ER  -