Gupta, Dinesh C Bacher, F.R Hughes, W.M <br/><br/>
Recombination lifetime measurements in silicon 

 - USA  ASTM  1998 
 - 392P 
<br/><br/><label>ISBN: </label>0-8031-2489-9 
<br/><br/><label>Subjects--Topical Terms: </label><br/>SEMICONDUCTORS TESTING CONGRESSES, SERVICE LIFE CONGRESSES
<br/><br/><label>Dewey Class. No.: </label>621.38152 REC