TY  - BOOK
AU  - Gupta, Dinesh C Bacher, F.R Hughes, W.M
TI  - Recombination lifetime measurements in silicon
SN  - 0-8031-2489-9
U1  - 621.38152 REC 
PY  - 1998///
CY  - USA
PB  - ASTM
KW  - SEMICONDUCTORS TESTING CONGRESSES, SERVICE LIFE CONGRESSES
ER  -