SAVIR, J, MCANNEY, W. H, BARDELL, PAUL H <br/><br/>
BUILT IN TEST FOR VLSI, PSEUDORANDOM TECHNIQUES 

 - NWEWYORK  JOHN WILEY  1987 
 - 354P 
<br/><br/><label>ISBN: </label>0-471-62463-2 
<br/><br/><label>Subjects--Topical Terms: </label><br/>INTEGRATED CIRCUITS VERY LARGE SCALE INTEGRATION TESTING
<br/><br/><label>Dewey Class. No.: </label>621.38173 BAR'B