TY  - BOOK
AU  - SAVIR, J, MCANNEY, W. H, BARDELL, PAUL H
TI  - BUILT IN TEST FOR VLSI, PSEUDORANDOM TECHNIQUES
SN  - 0-471-62463-2
U1  - 621.38173 BAR'B 
PY  - 1987///
CY  - NWEWYORK
PB  - JOHN WILEY
KW  - INTEGRATED CIRCUITS VERY LARGE SCALE INTEGRATION TESTING
ER  -