Purviance, J Meehan, M. D <br/><br/>
Yield and reliability in microwave circuit and system design 

 - BOSTON  ARTECH HOUSE  1993 
 - 276P 
<br/><br/><label>ISBN: </label>0-89006-527-6 
<br/><br/><label>Subjects--Topical Terms: </label><br/>COMPLETE AIDED DESIGN ENGINEERING DESIGN STATISTICAL METHOD MICROWAVES INTEGRATED CIRCUIT DESIGN AND CONSTRUCTION STATISTICAL METHOD
<br/><br/><label>Dewey Class. No.: </label>621.38152 MEE'Y