Christou, Aris <br/><br/>
Electromigration and electronic device degradation 

 - NEWYORK  JOHN WILEY  1994 
 - XIV, 343P 
<br/><br/><label>ISBN: </label>0-471-58489-4 
<br/><br/><label>Subjects--Topical Terms: </label><br/>INTEGRATED CIRCUITS DETERIORATION SEMICONDUCTORS
<br/><br/><label>Dewey Class. No.: </label>621.3815 ELE'C