TY  - BOOK
AU  - Christou, Aris
TI  - Electromigration and electronic device degradation
SN  - 0-471-58489-4
U1  - 621.3815 ELE'C 
PY  - 1994///
CY  - NEWYORK
PB  - JOHN WILEY
KW  - INTEGRATED CIRCUITS DETERIORATION SEMICONDUCTORS
ER  -