TH-SOF-1717-Development of Microstructure for Mechanical Fatigue Testing of Thin Film Silicon used for Fabrication of MEMS Inertial Sensors
Material type:
TextPublisher: Islamabad NUST College of EME 2019Subject(s): MS-MTS-17 MSTHESISDDC classification: 200 THE
| Item type | Current location | Home library | Shelving location | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Computer Files
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College of Electrical & Mechanical Engineering (CEME) | College of Electrical & Mechanical Engineering (CEME) | Reference | 200 THE (Browse shelf) | Available | TH-SOF-1717 |
Total holds: 0
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