Atomic force microscopy-based nanorobotics: modelling, simulation, setup building and experiments

By: Xie, huiMaterial type: TextTextPublisher: USA Springer 2011Description: xiv,342 PISBN: 9783642203282Subject(s): Modelling,Simulation,Setup Building ExperimentsDDC classification: 629.892 XIE
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Item type Current location Home library Collection Shelving location Call number Status Date due Barcode Item holds
Book Book College of Electrical & Mechanical Engineering (CEME)
College of Electrical & Mechanical Engineering (CEME)
NFIC General Stacks 629.892 XIE (Browse shelf) Available SCB-50028
Book Book College of Electrical & Mechanical Engineering (CEME)
College of Electrical & Mechanical Engineering (CEME)
NFIC General Stacks 629.892 XIE (Browse shelf) Available CEME-50028
Total holds: 0

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