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Automated biometrics: technologies and systems technologies and systems by David D. Zhang

by Zhang, David.

Publisher: Boston, Mass. ; London : Kluwer Academic, c2000Availability: Items available for loan: Central Library (CL)Call number: 006.4 ZHA (1).
Robust model-based fault diagnosis for dynamic systems / by Jie Chen, Ron J. Patton.

by Chen, J. (Jie) | Patton, Ron, 1949-.

Material type: Text Text; Format: print ; Literary form: Not fiction Publisher: Boston : Kluwer Academic Publishers, 1999Online access: Publisher description | Table of contents only Availability: Items available for loan: School of Mechanical & Manufacturing Engineering (SMME)Call number: 620.0044 CHE (1).
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