| 000 | 00977 a2200229 4500 | ||
|---|---|---|---|
| 003 | Nust | ||
| 005 | 20221129114616.0 | ||
| 010 | _a 97104998 | ||
| 020 | _a0333630394 | ||
| 035 | _a(OCoLC)35711081 | ||
| 040 | _cNust | ||
| 082 | 0 | 0 | _a621.3815,SHE |
| 100 | 1 |
_aShepherd, Peter _980119 |
|
| 245 | 1 | 0 |
_aIntegrated circuit design, fabrication, and test / _cPeter Shepherd. |
| 260 |
_aNew York : _bMcGraw-Hill, _cc1996. |
||
| 300 |
_axv, 223 p. : _bill. ; _c24 cm. |
||
| 505 | _aThe IC Design Process Where do we Start (Page-1), IC Families What technologies can we use (Page-21),Transistor Level Design (Page-42), IC Realization (Page-97), CAD how can we make the tasks Possible (Page-117), Testing how can we check it works (Page-146), Afterword the Future (Page-176). | ||
| 650 | 0 |
_aIntegrated circuits _xTesting. _9103765 |
|
| 650 | 0 | _aTelecommunication engineering | |
| 856 | 4 | 1 |
_3Table of contents _uhttp://www.loc.gov/catdir/toc/mh022/97104998.html |
| 942 |
_2ddc _cBK |
||
| 999 |
_c182142 _d182142 |
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