| 000 | 01092 a2200217 4500 | ||
|---|---|---|---|
| 003 | Nust | ||
| 005 | 20221206123322.0 | ||
| 010 | _a 87008319 | ||
| 020 | _a0471851353 | ||
| 040 | _cNust | ||
| 082 | 0 | 0 | _a621.381548,COR |
| 100 | 1 |
_aCortner, J. Max. _966545 |
|
| 245 | 1 | 0 |
_aDigital test engineering / _cJ. Max Cortner. |
| 260 |
_aNew York : _bWiley, _c1987. |
||
| 300 |
_axiv, 337 p. ; _c25 cm. |
||
| 505 | _aFaults and Failure Mechanisms (Page-1), Digital Testing Overview (Page-28), Stimulus Generation (Page-53), Expected Response Determination (Page-84), Circuit and Fault Modeling (Page-100), Automatic Test Equipment (Page-135), Device-Under Test Interface (Page-162), ATE Languages (Page-184), Diagnostics and Troubleshooting Aids (Page-206), Memory Testing (Page-233), Design for Testability (Page-265), Test Planning (Page-293). | ||
| 650 | 0 | _aTelecommunication Engineering. | |
| 856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/description/wiley032/87008319.html |
| 856 | 4 | 2 |
_3Table of Contents _uhttp://www.loc.gov/catdir/toc/onix03/87008319.html |
| 942 |
_2ddc _cBK |
||
| 999 |
_c182472 _d182472 |
||