| 000 | 01038 a2200205 4500 | ||
|---|---|---|---|
| 003 | Nust | ||
| 005 | 20221206110334.0 | ||
| 010 | _a 76017013 | ||
| 020 | _a0070042306 : | ||
| 040 | _cNust | ||
| 082 | 0 | 0 | _a621.3818,BEC |
| 100 | 1 |
_aBecker, Peter W. _9103632 |
|
| 245 | 1 | 0 |
_aDesign of systems and circuits for maximum reliability or maximum production yield / _cPeter W. Becker, Finn Jensen. |
| 260 |
_aNew York : _bMcGraw-Hill, _cc1977. |
||
| 300 |
_axiv, 293 p. : _bill. ; _c24 cm. |
||
| 505 | _aIntroduction (Page-1), Some Basic Reliability Concepts (Page-5), Mathematical Design (Page-69), A Mathematical Model of Yield or of Drift Reliability (Page-83), Methods for Computing the Probability of System or Circuit Success (Page-103), Basis for the Prediction of Yield and Drift Reliability (Page-152), Optimization Techniques (Page-176), Circuit Examples Illustrating the use of the Proposed Design Strategies (Page-193). | ||
| 650 | 0 | _aTelecommunication Engineering. | |
| 700 | 1 |
_aJensen, Finn, _d1937- _9103634 |
|
| 942 |
_2ddc _cBK |
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| 999 |
_c182490 _d182490 |
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