000 01135cam a2200349 a 4500
001 653525
003 OSt
005 20211221112510.0
008 940624s1995 enka b 001 0 eng
010 _a 94029098
020 _a0470234458
020 _a9788131701829
038 _akhadija
040 _aDLC
_cDLC
_dDLC
050 0 0 _aQC53
_b.B44 2011.
082 0 0 _a681.2
_220
_bBEN
100 1 _aBentley, John P.,
_d1943-
_986864
245 1 0 _aPrinciples of measurement systems /
_cJohn P. Bentley.
246 3 0 _aMeasurement systems
250 _a3rd ed.
260 _aHarlow [England] :
_bLongman Scientific & Technical ;
_aNew York, NY :
_bWiley,
_c1995.
300 _axi, 468 p. :
_bill. ;
_c25 cm.
500 _aIncludes index.
563 _aPB
650 0 _aPhysical instruments.
_986865
650 0 _aPhysical measurements.
_986866
650 0 _aEngineering instruments.
_986867
650 0 _aAutomatic control.
_986868
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
942 _2ddc
_cBK
999 _c33363
_d33363