000 01475cam a2200421La 4500
001 4240032
003 OSt
005 20211130113407.0
006 m u
007 cr cn-
008 001008s2000 nyua sb 001 0 eng d
020 _a0824719921
035 _a(OCoLC)45731214
035 _a(OCoLC)ocm45731214
035 _a(N$T)ocm45731214
035 _a(NNC)4240032
038 _aKhadija
040 _aN$T
_cN$T
_dOCL
_dOCLCQ
050 1 4 _aTA417.25
_bI52 2000eb
082 0 4 _a658.5
_221
_bGAI
100 _aChung, Frank H.
_985311
245 0 0 _aIndustrial applications of X-ray diffraction /
_cDeane K. Smith.
260 _aNew York :
_bMarcel Dekker,
_cc2000.
300 _axiv, 1006 p. :
_bill. ;
_c26 cm.
504 _aIncludes bibliographical references and index.
533 _aElectronic reproduction.
_bBoulder, Colo. :
_cNetLibrary,
_d2000.
_nAvailable via World Wide Web.
_nAccess may be limited to NetLibrary affiliated libraries.
563 _aHB
650 0 _aRadiography, Industrial.
_985312
650 0 _aX-rays
_xDiffraction.
_985313
655 7 _aElectronic books.
_2local
_985314
700 1 _aChung, Frank H.,
_d1930-
_985315
700 1 _aSmith, Deane K.
_q(Deane Kingsley)
_985316
710 2 _aNetLibrary, Inc.
_985317
776 1 _cOriginal
_z0824719921
_w(DLC) 99039511
_w(OCoLC)42603078
856 4 _uhttp://www.columbia.edu/cgi-bin/cul/resolve?clio4240032
_zClick here for full text.
942 _2ddc
_cBK
999 _c33487
_d33487