000 00640nam a22001697a 4500
020 _qHard Cover.
082 _a621.3
100 _aIqbal, Shahzad
245 _aItem Analysis and Internal Reliability of Entry Tests for prospective Electrical Engineering and Computer Science students in a University Setting /
_cShahzad Iqbal.
260 _aIslamabad:
_bSEECS - NUST.
_c2016.
300 _aix, 77 p. : ill. ;
_c30cm.
650 _aMs Thesis.
_918721
700 _aMs. Farzana Ahmed.
_919821
856 _uhttp://10.250.8.41:8080/xmlui/handle/123456789/6623
942 _2ddc
_cTHE
999 _c528203
_d528203