000 00413nam a2200133Ia 4500
005 20210429153915.0
008 210429s9999 xx 000 0 und d
082 _aMTL-MS IQ/MJ
100 _aKhurram Iqbal
_954759
245 2 _aA Study and Characterization of Thin Film Multilayer Structures (MLS) With si/sio2 Composition Si Substrate
260 _aISLAMABAD
_bSCME
_c2010
300 _a47P
942 _2ddc
_cREF
999 _c561119
_d561119