000 00496nam a22001817a 4500
003 CEME
005 20210628205400.0
008 210315b xxu||||| |||| 00| 0 eng d
020 _a0-7506-9472-6
040 _c.
082 _a621.381548 AFS'P
100 _aAfshar, Amir
_975264
245 _aPrinciples of semiconductor network testing
260 _aUSA
_bBUTTERWORTH
_c1995
300 _aXIV, 213P
650 _aINTEGRATING CIRCUIT TESTING SEMICONDUCTORS TESTING
_975265
942 _cBK
_2ddc
999 _c580716
_d580716